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| 441 | Tittle | 1149.1b-1994 - IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-0960-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 442 | Tittle | 1149.4-1999 - IEEE Standard for a Mixed-Signal Test Bus | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-1756-0 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 443 | Tittle | 1149.4-2010 - IEEE Standard for a Mixed-Signal Test Bus | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Signal Processing and Analysis | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6523-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 444 | Tittle | 1149.5-1995 - IEEE Standard for Module Test and Maintenance Bus (MTM-Bus) Protocol | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 0-7381-3747-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 445 | Tittle | 1149.6-2003 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-3577-9 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 446 | Tittle | 1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Communication, Networking and Broadcast Technologies, Components, Circuits, Devices and Systems, Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-0596-6 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 447 | Tittle | 1149.6-2015 - IEEE Standard for Boundary-Scan Testing of Advanced Digital Networks - Redline | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Communication, Networking and Broadcast Technologies, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-2079-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 448 | Tittle | 1149.7-2009 - IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6153-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 449 | Tittle | 1149.8.1-2012 - IEEE Standard for Boundary-Scan-Based Stimulus of Interconnections to Passive and/or Active Components | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-7392-4 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 450 | Tittle | 115-1983 - IEEE Guide: Test Procedures for Synchronous Machines | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-4331-6 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
