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| 451 | Tittle | 115-1995 - IEEE Guide: Test Procedures for Synchronous Machines Part I--Acceptance and Performance Testing Part II-Test Procedures and Parameter Determination for Dynamic Analysis | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-0776-9 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 452 | Tittle | 115-2009 - IEEE Guide for Test Procedures for Synchronous Machines Part I—Acceptance and Performance Testing Part II—Test Procedures and Parameter Determination for Dynamic Analysis | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6135-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 453 | Tittle | 115-2009 - IEEE Guide for Test Procedures for Synchronous Machines Part I—Acceptance and Performance Testing Part II—Test Procedures and Parameter Determination for Dynamic Analysis - Redline | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Transportation, Components, Circuits, Devices and Systems, Communication, Networking and Broadcast Technologies, Computing and Processing, Engineered Materials, Dielectrics and Plasmas | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5492-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 454 | Tittle | 115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-6347-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 455 | Tittle | 115-2019 - IEEE Guide for Test Procedures for Synchronous Machines Including Acceptance and Performance Testing and Parameter Determination for Dynamic Analysis - Redline | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-6695-0 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 456 | Tittle | 1150-1991 - IEEE Trial-Use Recommended Practice for Integrating Power Plant Computer-Aided Engineering (CAE) Applications | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 0-7381-3955-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 457 | Tittle | 1154-1991 - IEEE Standard for Programmed Inquiry, Learning, or Teaching (PILOT) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-1184-1 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 458 | Tittle | 1155-1992 - IEEE Standard for VMEbus Extensions for Instrumentation: VXIbus | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-1185-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 459 | Tittle | 1156.1-1993 - IEEE Standard Microcomputer Environmental Specifications for Computer Modules | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-1186-5 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 460 | Tittle | 1156.2-1996 - IEEE Standard for Environmental Specifications for Computer Systems | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-1187-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
