| 1361 | Tittle | 1616a-2010 - IEEE Standard for Motor Vehicle Event Data Recorders (MVEDRs) Amendment 1: MVEDR Connector Lockout Apparatus (MVEDRCLA) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Transportation | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6253-9 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1362 | Tittle | 1617-2007 - IEEE Guide for Detection, Mitigation, and Control of Concentric Neutral Corrosion in Medium-Voltage Underground Cables | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5701-6 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1363 | Tittle | 1619-2007 - IEEE Standard for Cryptographic Protection of Data on Block-Oriented Storage Devices | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-5523-7 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1364 | Tittle | 1619-2018 - IEEE Standard for Cryptographic Protection of Data on Block-Oriented Storage Devices | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-5280-9 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1365 | Tittle | 1619.1-2007 - IEEE Standard for Authenticated Encryption with Length Expansion for Storage Devices | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5360-5 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1366 | Tittle | 1619.1-2018 - IEEE Standard for Authenticated Encryption with Length Expansion for Storage Devices | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-5454-4 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1367 | Tittle | 1619.2-2010 - IEEE Standard for Wide-Block Encryption for Shared Storage Media | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6476-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1368 | Tittle | 162-1963 - IEEE Standard Definitions of Terms for Electronic Digital Computers | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 0-7381-4171-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1369 | Tittle | 1620-2004 - Standard for Test Methods for the Characterization of Organic Transistors and Materials | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-3993-7 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1370 | Tittle | 1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6016-0 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
