| 621 | Tittle | 1226.2-1993 - IEEE ABBET Trial-Use Standard for Ada-Based ATLAS-Level Test Procedure Interface for a Broad-Based | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 0-7381-4588-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 622 | Tittle | 1226.3-1998 - IEEE Standard for Software Interface for Resource Management for a Broad-Based Environment for Test (ABBET) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 0-7381-3966-1 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 623 | Tittle | 1226.6-1996 - IEEE ABBET(R)- IEEE Guide for the Understanding of the "A Broad-Based Environment for Test (ABBET)(R)" Standard | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-55937-726-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 624 | Tittle | 1227-1990 - IEEE Guide for the Measurement of DC Electric-Field Strength and Ion Related Quantities | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-0381-5 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 625 | Tittle | 1228-1994 - IEEE Standard for Software Safety Plans | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-0420-1 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 626 | Tittle | 1232-1995 - IEEE Standard for Artificial Intelligence and Expert System Tie to Automatic Test Equipment (AI-ESTATE): Overview and Architecture | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-3531-1 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 627 | Tittle | 1232-2002 - (Replaced) IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI- ESTATE) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-3296-9 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 628 | Tittle | 1232-2010 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6525-7 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 629 | Tittle | 1232.1-1997 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Data and Knowledge Specification | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-3532-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 630 | Tittle | 1232.2-1998 - IEEE Standard for Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE): Service Specification | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-3533-5 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
