You have searched for collection T
| 1461 | Tittle | 1667-2015 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-2248-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1462 | Tittle | 1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-5005-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1463 | Tittle | 1667-2018 - IEEE Standard for Discovery, Authentication, and Authorization in Host Attachments of Storage Devices - Redline | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-5397-4 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1464 | Tittle | 1668-2014 - IEEE Trial-Use Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-9279-6 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1465 | Tittle | 1668-2017 - IEEE Recommended Practice for Voltage Sag and Short Interruption Ride-Through Testing for End-Use Electrical Equipment Rated Less than 1000 V | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-4389-0 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1466 | Tittle | 167-1966 - IEEE Test Procedure for Facsimile | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Communication, Networking and Broadcast Technologies, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-0637-6 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1467 | Tittle | 1671-2006 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5246-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1468 | Tittle | 1671-2006 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information Via XML | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5246-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1469 | Tittle | 1671-2010 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6456-4 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1470 | Tittle | 1671.1-2009 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-8152-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
