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| 1471 | Tittle | 1671.1-2009 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions | ||
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| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-6066-5 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1472 | Tittle | 1671.1-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Test Descriptions | ||
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| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-4631-0 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1473 | Tittle | 1671.2-2008 - IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5804-4 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1474 | Tittle | 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description | ||
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| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-8144-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1475 | Tittle | 1671.2-2012 - IEEE Standard for Automatic Test Markup Language (ATML) Instrument Description - Redline | ||
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| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Components, Circuits, Devices and Systems, Engineered Materials, Dielectrics and Plasmas, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-8376-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1476 | Tittle | 1671.3-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-9237-6 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1477 | Tittle | 1671.3-2017 - IEEE Standard for Automatic Test Markup Language (ATML) Unit Under Test (UUT) Description | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-4567-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1478 | Tittle | 1671.4-2007 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5370-4 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1479 | Tittle | 1671.4-2014 - IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing, Power, Energy and Industry Applications | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-9022-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 1480 | Tittle | 1671.5-2008 - IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-8166-0 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
