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| 47201 | Tittle | Test Workshop, ATW, Annual Atlantic | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47202 | Tittle | Test Workshop, LATW, Latin American | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47203 | Tittle | Test, Asian Symposium (ATS) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2377-5386 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47204 | Tittle | Testability Assessment (IWoTA), International Workshop on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47205 | Tittle | Testbeds and Research Infrastructures for the Development of Networks and Communities (TRIDENTCOM), International Conference on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Communication, Networking and Broadcast Technologies | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47206 | Tittle | Testing and Diagnosis, ICTD, IEEE Circuits and Systems International Conference on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2324-8491 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47207 | Tittle | Testing: Academic & Industrial Conference - Practice and Research Techniques (taic part 2008) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | General Topics for Engineers | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 978-1-5090-7664-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47208 | Tittle | Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART06) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Communication, Networking and Broadcast Technologies | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 978-1-5090-9545-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47209 | Tittle | Testing: Academic and Industrial Conference - Practice And Research Techniques (TAICPART) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Communication, Networking and Broadcast Technologies | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47210 | Tittle | Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 978-1-5090-8503-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
