| 47351 | Tittle | TESOL Quarterly | ||
|---|---|---|---|---|
| Publisher | JSTOR (JSTOR) | Collection Name | JSTOR Complete Collection - ESS | |
| Subject | Education | Resource Type | E-Journal | |
| School | SHSS | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | ESS | ||
| 47352 | Tittle | TEST | ||
|---|---|---|---|---|
| Publisher | Springer-Nature (SN-Engg Titles) | Collection Name | S&T Package | |
| Subject | Mathematics and Statistics | Resource Type | E-Journal | |
| School | SE | E-ISSN | 1863-8260 | |
| Backfile Access Detail | 1997 - Current Issue | Perpetual Access Detail | Yes | |
| Subscription Status | Yes | Access Provided By | IIT Mandi | |
| 47353 | Tittle | Test and Measurement (ICTM), International Conference on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Robotics and Control Systems, Signal Processing and Analysis, Power, Energy and Industry Applications, Computing and Processing | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2157-5606 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47354 | Tittle | Test Conference in Asia (ITC-Asia), International | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Computing and Processing, Power, Energy and Industry Applications, Robotics and Control Systems | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47355 | Tittle | Test Conference, IEEE International | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2378-2250 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47356 | Tittle | Test Symposium (ETS), IEEE European | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 1558-1780 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47357 | Tittle | Test Workshop, ATW, Annual Atlantic | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47358 | Tittle | Test Workshop, LATW, Latin American | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47359 | Tittle | Test, Asian Symposium (ATS) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2377-5386 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 47360 | Tittle | Testability Assessment (IWoTA), International Workshop on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
