| 971 | Tittle | 1450.1-2005 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-4733-8 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 972 | Tittle | 1450.2-2002 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-3504-5 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 973 | Tittle | 1450.3-2007 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5518-0 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 974 | Tittle | 1450.4-2017 - IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Test Flow Specification | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Power, Energy and Industry Applications, Components, Circuits, Devices and Systems, Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-1-5044-4643-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 975 | Tittle | 1450.6-2006 - IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-4805-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 976 | Tittle | 1450.6.1-2009 - IEEE Standard for Describing On-Chip Scan Compression | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5962-1 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 977 | Tittle | 1450.6.2-2014 - IEEE Standard for Memory Modeling in Core Test Language | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Computing and Processing | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-8972-7 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 978 | Tittle | 1451.0-2007 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Common Functions, Communication Protocols, and Transducer Electronic Data Sheet (TEDS) Formats | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-5598-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 979 | Tittle | 1451.1-1999 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Network Capable Application Processor Information Model | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-1768-3 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 980 | Tittle | 1451.2-1997 - IEEE Standard for a Smart Transducer Interface for Sensors and Actuators - Transducer to Microprocessor Communication Protocols and Transducer Electronic Data Sheet (TEDS) Formats | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Standard | |
| School | SCEE | E-ISSN | 978-0-7381-1386-9 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
