You have searched for publisher ieee
| 38801 | Tittle | Test Conference, IEEE International | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2378-2250 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38802 | Tittle | Test Symposium (ETS), IEEE European | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 1558-1780 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38803 | Tittle | Test Workshop, ATW, Annual Atlantic | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38804 | Tittle | Test Workshop, LATW, Latin American | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38805 | Tittle | Test, Asian Symposium (ATS) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2377-5386 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38806 | Tittle | Testability Assessment (IWoTA), International Workshop on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Power, Energy and Industry Applications | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38807 | Tittle | Testbeds and Research Infrastructures for the Development of Networks and Communities (TRIDENTCOM), International Conference on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Communication, Networking and Broadcast Technologies | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | ||
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38808 | Tittle | Testing and Diagnosis, ICTD, IEEE Circuits and Systems International Conference on | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 2324-8491 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38809 | Tittle | Testing: Academic & Industrial Conference - Practice and Research Techniques (taic part 2008) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | General Topics for Engineers | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 978-1-5090-7664-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
| 38810 | Tittle | Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART06) | ||
|---|---|---|---|---|
| Publisher | IEEE (IEEE) | Collection Name | IEEE Xplore digital library | |
| Subject | Components, Circuits, Devices and Systems, Signal Processing and Analysis, Communication, Networking and Broadcast Technologies | Resource Type | Conference Proceeding | |
| School | SCEE | E-ISSN | 978-1-5090-9545-2 | |
| Backfile Access Detail | Complete | Perpetual Access Detail | No | |
| Subscription Status | Access Provided By | IIT Mandi | ||
