| Biblio No. |
Subject |
Title |
Author |
Publisher |
Image |
| 67201 |
Electrical Engineering |
Semiconductor Material and Device Characterization |
Dieter K. Schroder |
IEEE Press-Wiley |
 |
| 67202 |
Electrical Engineering |
Semiconductor Memories:Technology, Testing, and Reliability |
Ashok K. Sharma |
IEEE Press-Wiley |
 |
| 67203 |
Electrical Engineering |
Sensor Network Operations |
Shashi Phoha; Thomas F. La Porta; Christopher Griffin |
IEEE Press-Wiley |
 |
| 67204 |
Computer science |
Service-Learning in the Computer and Information Sciences:Practical Applications in Engineering Education |
Brian A. Nejmeh |
IEEE Press-Wiley |
 |
| 67205 |
Electrical Engineering |
Signal Analysis:Time, Frequency, Scale, and Structure |
Ronald L. Allen; Duncan Mills |
IEEE Press-Wiley |
 |
| 67206 |
Electrical Engineering |
Signal Integrity Effects in Custom IC and ASIC Designs |
Raminderpal Singh |
IEEE Press-Wiley |
 |
| 67207 |
Electrical Engineering |
Signal Processing of Power Quality Disturbances |
Math H. Bollen; Irene Gu |
IEEE Press-Wiley |
 |
| 67208 |
Electrical Engineering |
Silicon Germanium:Technology, Modeling, and Design |
Raminderpal Singh; Modest M. Oprysko; David Harame |
IEEE Press-Wiley |
 |
| 67209 |
Electrical Engineering |
Single and Multi-Carrier DS-CDMA:Multi-User Detection, Space-Time Spreading, Synchronisation, Networking?and Standards |
Lajos L. Hanzo; L-L. Yang; E-L. Kuan; K. Yen |
IEEE Press-Wiley |
 |
| 67210 |
Basic Engineering |
Single Event Effects in Aerospace |
Edward Petersen |
IEEE Press-Wiley |
 |
